Research Keywords
Paper Recommendation
1997 Experiences With Implementation Of IDDQ Test For Identification And Automotive Products.

1997 A New Probe Card Technology Using Compliant MicrospringsTM.

1997 How Seriously Do You Take Your Possible-Detect Faults?

1995 Generation Of Search State Equivalence For Automatic Test Pattern Generation.

1997 RF Introduction And Analog Junction Techniques For Finding Opens.

1997 Design, Fabrications And Use Of Mixed-Signal IC Testability Structures.

1997 Low-Cost ATE PinElectronics For Multigigabit-per-Second At-Speed Test.

1997 A New Validation Methodology Combining Test And Formal Verification For PowerPCTM Microprocessor Arrays.

2015 16.2 A Large-area Image Sensing And Detection System Based On Embedded Thin-film Classifiers.

1997 Design And Realization Of An Accurate Built-In Current Sensor For On-Line Power Dissipation Measurement And IDDQ Testing.

1997 The Case Of Partial Scan.

2012 A ΔΣ Interface For MEMS Accelerometers Using Electrostatic Spring-constant Modulation For Cancellation Of Bondwire Capacitance Drift.

1997 Next-Generation PowerPCTM Microprocessor Test Strategy Improvements.

2012 A Spurious-Free Switching Buck Converter Achieving Enhanced Light-Load Efficiency By Using A ΔΣ-Modulator Controller With A Scalable Sampling Frequency.

1997 Test Access Of TAP'ed & Non-TAP'ed Cores.

1997 On-Line Testable Logic Desgin For FPGA Implementation.

1967 Dataless Programming.

1997 IDD Pulse Response Testing Applied To Complex CMOS ICs.

2016 A Low-Jitter And Fractional-Resolution Injection-Locked Clock Multiplier Using A DLL-Based Real-Time PVT Calibrator With Replica-Delay Cells.

1997 System-Level Boundary-Scan In A Highly Integrated Switch.