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E A Irene
HIndex: 13
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Kinetics
Optical switch
Crystal structure
Charged particle
Mass spectrometry
Refractive index
Room temperature
Silicon
Ellipsometry
Thin film
Single crystal
Ion beam
Temperature
Real-time computing
Dielectric
Redox
Microstructure
Measurement
Materials Science
Atomic force microscopy
Interface
Oscillation
Time of flight
Film
Surface roughness
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Kinetics
Optical switch
Crystal structure
Charged particle
Mass spectrometry
Refractive index
Room temperature
Silicon
Ellipsometry
Thin film
Single crystal
Ion beam
Temperature
Real-time computing
Dielectric
Redox
Microstructure
Measurement
Materials Science
Atomic force microscopy
Interface
Oscillation
Time of flight
Film
Surface roughness
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Author Name
Affiliation
Papers
E A Irene
University Of North Carolina At Chapel Hill
165
E A Irene
University Of North Carolina At Chapel Hill
109
E A Irene
Rensselaer Polytechnic Institute
5
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