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Jacob A Abraham
HIndex: 27
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Software Testing
Fault tolerance
CMOS
Very-large-scale integration
Combinational logic
Electronic design automation
Computer hardware
Fault model
Sequential logic
Logic synthesis
Error detection and correction
Integrated circuit
Application software
Computational model
System on a chip
Real-time computing
Integrated circuit design
Automatic test pattern generation
Logic gate
System testing
Chip
Robustness
Network switch
Fault detection and isolation
Design for testing
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Software Testing
Fault tolerance
CMOS
Very-large-scale integration
Combinational logic
Electronic design automation
Computer hardware
Fault model
Sequential logic
Logic synthesis
Error detection and correction
Integrated circuit
Application software
Computational model
System on a chip
Real-time computing
Integrated circuit design
Automatic test pattern generation
Logic gate
System testing
Chip
Robustness
Network switch
Fault detection and isolation
Design for testing
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Match this author profile with one of the following researchers:
Author Name
Affiliation
Papers
Jacob A Abraham
Public Service Enterprise Group
383
Jacob A Abraham
John Deere
104
Jacob A Abraham
John Deere
93
Jacob A Abraham
United States Department Of Energy
1
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