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B G Svensson
HIndex: 23
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Secondary ion mass spectrometry
Hydrogen
Activation energy
Zinc
Silicon
Energy level
Boron
Phosphorus
Transmission electron microscopy
Band gap
Natural science
Materials Science
Schottky barrier
Annealing
Ion implantation
Crystallographic defect
Heat treating
Diffusion
Thin film
Condensed matter physics
Room temperature
Electron beam processing
Nitrogen
Ion beam
Kinetics
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Secondary ion mass spectrometry
Hydrogen
Activation energy
Zinc
Silicon
Energy level
Boron
Phosphorus
Transmission electron microscopy
Band gap
Natural science
Materials Science
Schottky barrier
Annealing
Ion implantation
Crystallographic defect
Heat treating
Diffusion
Thin film
Condensed matter physics
Room temperature
Electron beam processing
Nitrogen
Ion beam
Kinetics
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Match this author profile with one of the following researchers:
Author Name
Affiliation
Papers
B G Svensson
Ohio State University
551
B G Svensson
Royal Institute Of Technology
37
B G Svensson
Royal Institute Of Technology
32
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