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D Yun
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International Space Station
Markov process
Silicon
Epitaxy
Plasma-enhanced chemical vapor deposition
Metal
Superlattice
Capacitive sensing
Annealing
Thin-film transistor
Band gap
Quantum well
Logic gate
Hot-carrier injection
Dynamic random-access memory
Impact ionization
Index term
Photonic crystal
Chromatography
Azuma's inequality
Chemical vapor deposition
Control engineering
Scheduling
Throughput
Network topology
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International Space Station
Markov process
Silicon
Epitaxy
Plasma-enhanced chemical vapor deposition
Metal
Superlattice
Capacitive sensing
Annealing
Thin-film transistor
Band gap
Quantum well
Logic gate
Hot-carrier injection
Dynamic random-access memory
Impact ionization
Index term
Photonic crystal
Chromatography
Azuma's inequality
Chemical vapor deposition
Control engineering
Scheduling
Throughput
Network topology
Paper Recommendation
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Match this author profile with one of the following researchers:
Author Name
Affiliation
Papers
D Yun
Wuhan University
8
D Yun
Boston Children S Hospital
6
D Yun
Lg Electronics
4
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