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Theodore V Vorburger
HIndex: 11
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Carbon nanotube
Surface finish
Surface roughness
Topography
Scanning probe microscopy
Forensic science
Dimensional metrology
Sensor
Heterodyne
Scanning electron microscope
Nanotechnology
Metrology
Surface
Scanning tunneling microscope
Scattering
Cross-correlation
System of measurement
Computer data storage
Atomic force microscopy
Calibration
Light scattering
Astronomical interferometer
Critical dimension
Interferometry
Semiconductor
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Carbon nanotube
Surface finish
Surface roughness
Topography
Scanning probe microscopy
Forensic science
Dimensional metrology
Sensor
Heterodyne
Scanning electron microscope
Nanotechnology
Metrology
Surface
Scanning tunneling microscope
Scattering
Cross-correlation
System of measurement
Computer data storage
Atomic force microscopy
Calibration
Light scattering
Astronomical interferometer
Critical dimension
Interferometry
Semiconductor
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Affiliation
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Theodore V Vorburger
University Of Delaware
147
Theodore V Vorburger
Drexel University
7
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