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M J Uren
HIndex: 22
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Temperature measurement
Silicon
Electric field
Wide-bandgap semiconductor
Field-effect transistor
Logic gate
Thermal analysis
Amplifier
Radio frequency
Raman spectroscopy
Thermal conductivity
High-electron-mobility transistor
Thermal resistance
Schottky diode
Semiconductor device
Voltage
Reliability
Temperature
Epitaxy
Electricity generation
Image resolution
CMOS
Cross section
Dissipation
Silicon on insulator
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Temperature measurement
Silicon
Electric field
Wide-bandgap semiconductor
Field-effect transistor
Logic gate
Thermal analysis
Amplifier
Radio frequency
Raman spectroscopy
Thermal conductivity
High-electron-mobility transistor
Thermal resistance
Schottky diode
Semiconductor device
Voltage
Reliability
Temperature
Epitaxy
Electricity generation
Image resolution
CMOS
Cross section
Dissipation
Silicon on insulator
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Affiliation
Papers
M J Uren
University Of Cambridge
265
M J Uren
University Of St Andrews
1
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