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Byron Dom
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Robustness
Inspection
Feature selection
Pattern recognition
Unsupervised learning
Algorithm
Computer vision
Layout
Ground truth
Integrated circuit
Shape
Model selection
Chip
Computer hardware
Constant false alarm rate
Image segmentation
High-throughput screening
Machine learning
Artificial intelligence
Pixel
Image analysis
Encoding
Machine vision
Feature vector
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Minimum description length
Robustness
Inspection
Feature selection
Pattern recognition
Unsupervised learning
Algorithm
Computer vision
Layout
Ground truth
Integrated circuit
Shape
Model selection
Chip
Computer hardware
Constant false alarm rate
Image segmentation
High-throughput screening
Machine learning
Artificial intelligence
Pixel
Image analysis
Encoding
Machine vision
Feature vector
Paper Recommendation
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Byron Dom
Fx Palo Alto Laboratory
41
Byron Dom
Ibm
35
Byron Dom
Yahoo
3
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