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Bijan Davari
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Microelectronics
Logic gate
Annealing
Boron
Low voltage
Tungsten
Ring oscillator
Voltage
Frequency
Lithography
Ion implantation
Electronic circuit
Short-channel effect
Doping
Threshold voltage
Silicon
Degradation
Copper
Nondestructive testing
Semiconductor
Capacitance
CMOS
Temperature
Silicon on insulator
International System of Units
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Microelectronics
Logic gate
Annealing
Boron
Low voltage
Tungsten
Ring oscillator
Voltage
Frequency
Lithography
Ion implantation
Electronic circuit
Short-channel effect
Doping
Threshold voltage
Silicon
Degradation
Copper
Nondestructive testing
Semiconductor
Capacitance
CMOS
Temperature
Silicon on insulator
International System of Units
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Bijan Davari
Rensselaer Polytechnic Institute
101
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