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M Fayolle
HIndex: 9
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Permittivity
Electronics
Computer hardware
Process integration
Lithography
Temperature
Resist
Software Testing
Physics
Chemical-mechanical planarization
Tin
Silicon
Copper
Metallizing
Integrated circuit
Chemical vapor deposition
Polishing
Electrical resistivity and conductivity
Carbon nanotube
Interconnection
Dielectric
Slurry
Porous medium
Emerging technologies
Etching
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Permittivity
Electronics
Computer hardware
Process integration
Lithography
Temperature
Resist
Software Testing
Physics
Chemical-mechanical planarization
Tin
Silicon
Copper
Metallizing
Integrated circuit
Chemical vapor deposition
Polishing
Electrical resistivity and conductivity
Carbon nanotube
Interconnection
Dielectric
Slurry
Porous medium
Emerging technologies
Etching
Paper Recommendation
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Match this author profile with one of the following researchers:
Author Name
Affiliation
Papers
M Fayolle
Stmicroelectronics
45
M Fayolle
Curie Institute
24
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