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C H Seager
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Chemical reaction
Electrical resistance and conductance
Semiconductor device
Ion implantation
Annealing
Energy level
Zinc
Ion beam
Physical property
Silicon
Electrical resistivity and conductivity
Band gap
Cathode ray
Crystal structure
Mathematical model
Nitrogen
Electron paramagnetic resonance
Materials Science
Absorption spectroscopy
Grain boundary
Microstructure
Kinetics
Thin film
Electric field
Electromagnetic radiation
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Chemical reaction
Electrical resistance and conductance
Semiconductor device
Ion implantation
Annealing
Energy level
Zinc
Ion beam
Physical property
Silicon
Electrical resistivity and conductivity
Band gap
Cathode ray
Crystal structure
Mathematical model
Nitrogen
Electron paramagnetic resonance
Materials Science
Absorption spectroscopy
Grain boundary
Microstructure
Kinetics
Thin film
Electric field
Electromagnetic radiation
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C H Seager
Sandia National Laboratories
156
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