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Eric Pottier
HIndex: 15
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L band
Image resolution
Magnetoresistance
Surface roughness
Water content
Polarization
Covariance matrix
Synthetic aperture radar
Polarimetry
Oren–Nayar reflectance model
Matrix decomposition
Statistics
Scattering
Interferometry
Specific absorption rate
Contextual image classification
Vegetation
Frequency
Radar imaging
Azimuth
Remote sensing
Layout
Backscatter
Data analysis
Speckle pattern
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L band
Image resolution
Magnetoresistance
Surface roughness
Water content
Polarization
Covariance matrix
Synthetic aperture radar
Polarimetry
Oren–Nayar reflectance model
Matrix decomposition
Statistics
Scattering
Interferometry
Specific absorption rate
Contextual image classification
Vegetation
Frequency
Radar imaging
Azimuth
Remote sensing
Layout
Backscatter
Data analysis
Speckle pattern
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Eric Pottier
Chinese Academy Of Sciences
296
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